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| Quantity | Price (inc GST) |
|---|---|
| 1+ | S$88.270 (S$96.2143) |
| 10+ | S$84.360 (S$91.9524) |
| 25+ | S$80.760 (S$88.0284) |
Product Information
Product Overview
The MP-P50 D is a precision spring-loaded test probe engineered for reliable electrical contact in PCB testing, in-circuit testing (ICT), and functional verification applications. Featuring a 0.6mm outer diameter plunger and Ø0.9mm mounting requirement, this probe is suitable for high-density layouts while maintaining stable mechanical and electrical performance. With gold-plated contact surfaces and high-quality spring construction, the MP-P50 D delivers low contact resistance, consistent spring force, and dependable long-term operation in production and development environments.
- Compact 0.6mm OD plunger for dense PCB designs
- Gold-plated contact surfaces for enhanced conductivity and corrosion resistance
- Consistent 80g spring force for stable electrical contact
- 3A continuous current rating
- Designed for fixture-based and automated testing systems
- Plunger: Full-hard Beryllium Copper, gold-plated over nickel
- Barrel: Brass, gold-plated
- Spring: Stainless steel
- Receptacle: Brass, gold-plated
Applications
Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development
Technical Specifications
Plunger
Multicomp Pro Test Probe Tips
Test Probes
No SVHC (25-Jun-2025)
Technical Docs (1)
Legislation and Environmental
Country in which last significant manufacturing process was carried outCountry of Origin:China
Country in which last significant manufacturing process was carried out
RoHS
Product Compliance Certificate