MP-P50 V
Test Accessory, 0.9mm OD, Plunger, Test Probes, Multicomp Pro Test Probe Tips
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| Quantity | Price (inc GST) |
|---|---|
| 1+ | S$88.270 (S$96.2143) |
| 10+ | S$84.360 (S$91.9524) |
| 25+ | S$80.760 (S$88.0284) |
Product Information
Product Overview
The MP-P50 V is a precision spring-loaded test probe designed to deliver stable, low-resistance electrical contact in PCB testing, in-circuit testing (ICT), and functional verification applications. Featuring a 0.9mm outer diameter plunger with a 0.7mm tip profile, this probe provides enhanced mechanical stability while maintaining suitability for fine-pitch and high-density layouts. Engineered for consistent performance in demanding production and development environments, the MP-P50 V combines high-quality materials with gold-plated contact surfaces to ensure reliable conductivity and long operational life.
- 0.9mm OD plunger for robust mechanical performance
- 0.7mm tip profile for accurate PCB pad contact
- Gold-plated contacts for superior conductivity and corrosion resistance
- Stable 80g spring force for consistent electrical connection
- Rated for 3A continuous current
- Plunger: Full-hard Beryllium Copper, gold-plated over nickel
- Barrel: Brass, gold-plated
- Spring: Stainless steel
- Receptacle: Brass, gold-plated
Applications
Automated Test Equipment, Test & Measurement, Electronics Design, Electronics Service, Industrial Automation, Manufacturing, Quality Control, Prototyping, Semiconductor, Research & Development
Technical Specifications
Plunger
Multicomp Pro Test Probe Tips
Test Probes
No SVHC (25-Jun-2025)
Technical Docs (1)
Legislation and Environmental
Country in which last significant manufacturing process was carried outCountry of Origin:China
Country in which last significant manufacturing process was carried out
RoHS
Product Compliance Certificate